What Is Voltage Dips — IEC 61000-4-11?
Voltage sag test is an immunity test in which the continuity of the device's function is evaluated by reducing the supply voltage at a defined rate and time. It is defined in IEC 61000-4-11.
Purpose of Voltage Dips — IEC 61000-4-11
The aim is to verify that the device behaves safely and recovers acceptably during short-term voltage drops in the network.
Which Products Is Voltage Dips — IEC 61000-4-11 Applied To?
- Mains connected electronic devices
- Industrial control and drive equipment
- Information-technology equipment
- Medical devices
- White goods
In Which Sectors Is Voltage Dips — IEC 61000-4-11 Used?
Standards Related to Voltage Dips — IEC 61000-4-11
- IEC 61000-4-11voltage sag and short interruption immunity test
Voltage Dips — IEC 61000-4-11 Conditions
- Collapse depth
- Stepping down to defined percentage of rated voltage (e.g. 70%, 40%, 0%)
- Time
- Defined in terms of grid period (e.g. 0.5, 1, 10, 25, 250 periods)
- Phase angle
- Applied at zero crossing and defined angles
- Repeats
- Defined number of repetitions for each combination
Equipment for Voltage Dips — IEC 61000-4-11
- Voltage sag simulator or programmable AC source
- Phase synchronization scheme
- Function-monitoring system
- Current capacity is sufficient feeding
Sample Requirements for Voltage Dips — IEC 61000-4-11
- The sample should be operated in the typical and most unfavorable load condition
- Function monitoring and recovery behavior should be defined
- Rated voltage and current must be documented
- Reboot behavior should be observed
Duration of Voltage Dips — IEC 61000-4-11
It depends on the number of combinations; typically half business day.
Voltage Dips — IEC 61000-4-11 Procedure
- 1The collapse depths and durations to be applied are determined.
- 2The sample is operated at a defined load condition.
- 3Each combination is applied at a defined phase angle and number of times.
- 4The behavior and recovery of the device are observed.
- 5Observations are classified according to performance criteria.
Voltage Dips — IEC 61000-4-11 Acceptance Criteria
The resulting performance criterion is evaluated as A, B or C. It is essential not to enter into a dangerous situation for safety.
Evaluation of Results
Device reboot behavior and data loss are also evaluated. Some product standards allow shutdowns for certain periods of time.
Voltage Dips — IEC 61000-4-11 Report
- Standard applied
- Collapse depths, times and phase angles
- load case
- Function and recovery observations
- Performans kriteri sonucu
Accreditation
EUROLAB holds internationally recognised accreditation obtained from accreditation bodies party to the IAF and ILAC multilateral recognition arrangements, under ISO/IEC 17025 for laboratory testing, ISO/IEC 17020 for inspection and surveillance, and ISO/IEC 17021-1 and ISO/IEC 17065 for system and product certification. This chain ensures the reports and certificates issued are accepted worldwide.
Whether this test can be offered within accredited scope depends on your product and the standard applied; since accreditation is method-based, the scope is confirmed in writing at the quotation stage.
Scope and authorisationsRelated Regulations
- EMC 2014/30/EU
- MDR 2017/745 (medical)
EMC / EMI Testleri — What Does This Testing Field Cover?
The section below describes the field that the Voltage Dips test belongs to; the conditions and acceptance criteria of this particular test are given in the sections above. The scope specific to your product is confirmed in writing at the quotation stage.
EMC testing answers a question with two sides: does the device emit an unacceptable level of electromagnetic interference into its surroundings (emission), and does it withstand the interference coming from them (immunity)? The two sides are measured with separate tests and separate set-ups, and both are required.
The field exists because of a simple physical fact: every conductor carrying current behaves like an antenna. A switched-mode power supply, a motor drive or the clock signal of a microcontroller radiates radio frequency energy even though it was never designed to. The same conductor also works in reverse: an external field induces a voltage across it. In an environment crowded with devices, this mutual effect means devices disturbing one another.
On the emission side, conducted and radiated emission are measured separately. Conducted emission is the interference the device imposes on its mains and communication cables and dominates at lower frequencies. Radiated emission is the field the device releases into the air and comes to the fore at higher frequencies. The two are measured in different set-ups, and the limits vary by product group.
On the immunity side, real-world sources of interference are simulated: electrostatic discharge (human touch), radiated radio frequency fields (a nearby transmitter), electrical fast transients (switching), surges (lightning and mains events), conducted radio frequency, power-frequency magnetic fields, voltage dips and short interruptions.
The standard to be applied depends on WHERE the product is used, and that choice determines the entire outcome. Residential and industrial environments carry different sets of limits; in vehicles the UNECE R10 regime applies rather than CE; for medical devices IEC 60601-1-2 brings additional requirements; and for products containing a radio, radio legislation comes into play and harmonised ETSI standards are used.
In immunity testing the acceptance criterion is a PERFORMANCE CRITERION class, not a binary pass/fail. A device continuing to function without interruption during the test, being temporarily affected and recovering by itself, or recovering only through user intervention are different classes. Which class is acceptable is defined in the product standard; the tolerance for a device carrying a safety function differs from that of a consumer device.
The most common shortcoming of an EMC file is that it covers only one side. A file carrying an emission report alone is not complete in terms of the EMC directive. The second common gap is a test set-up that does not represent actual use: if the device is measured on a bare bench with cables different from its real ones, the result does not carry over to the field.
Method groups in this field
Conducted emission
Interference imposed on the cable through mains and communication ports, measured via an artificial mains network (LISN).
Radiated emission
The field released into the air by the device, measured at a defined distance in an anechoic or semi-anechoic chamber.
Harmonics and flicker
The harmonic content of the current drawn from the mains and voltage fluctuation; the side that affects mains quality.
Electrostatic discharge
Contact and air discharge together with indirect discharge; the most frequently applied immunity test.
Radiated and conducted RF immunity
The device is exposed to a defined field strength and to an RF signal injected into the cable.
Mains-borne events
Electrical fast transients, surges, voltage dips and short interruptions.
Commonly confused in this field
- An emission report alone does not complete an EMC file; immunity must be demonstrated as well.
- An FCC report is not accepted in a CE file; the limits, measurement distances and set-ups are different.
- The EMC Directive does not apply to vehicles; the UNECE R10 regime does. Specifications requiring both together should be reviewed.
- The warning that a Class A device may cause interference in a residential environment is mandatory in the manual; market surveillance checks that this warning is present.
- The test set-up is part of the report. If cable type, length or routing changes, the result changes; measurement must be made in the series-production configuration.
- CISPR 22 and CISPR 13 have been withdrawn; their current counterparts are CISPR 32 and CISPR 35.
Which decisions these results support
- CE declaration under the EMC Directive
- The EMC part of radio equipment conformity
- A UNECE R10 file for a vehicle component
- Resolving field interference complaints and correcting the design
- Assessing the EMC impact of a board or wiring-harness change
Related Tests
Frequently Asked Questions About Voltage Dips — IEC 61000-4-11
According to which standard is Voltage Dips made?
Voltage Dips is executed in scope IEC 61000-4-11, IEC 61000-4-34, IEC 61000-6-1 and IEC 61000-6-2. The limit values and acceptance criteria to be applied are defined in the product standard; The version valid for your product is confirmed in writing at the offer stage.
Which products does Voltage Dips apply to?
Mainly applied to Mains connected electronic devices, Industrial control and drive equipment, Information-technology equipment, Medical devices and White goods. Whether your product is included in the scope is determined by examining its technical specifications and intended use.
Under what conditions is Voltage Dips done?
The determining parameters are: Collapse depth — Stepping down to defined percentage of rated voltage (e.g. 70%, 40%, 0%), Time — Defined in terms of grid period (e.g. 0.5, 1, 10, 25, 250 periods) and Phase angle — Applied at zero crossing and defined angles. The full terms are in the "Test Conditions" section on the page and vary depending on the product standard.
What kind of sample is needed for Voltage Dips?
The sample should be operated in the typical and most unfavorable load condition, Function monitoring and recovery behavior should be defined and Rated voltage and current must be documented. The number of samples is determined according to the product standard and the scope to be reported.
How long does Voltage Dips take?
It depends on the number of combinations; typically half business day. This duration belongs to the experiment itself; sample preparation, queuing and reporting are also evaluated. A realistic schedule for your product is given in the offer.
What is the Voltage Dips result called "appropriate"?
The resulting performance criterion is evaluated as A, B or C. It is essential not to enter into a dangerous situation for safety.